The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Oct. 15, 2024
Bruker Nano Gmbh, Berlin, DE;
Tim Heek, Kranenburg, DE;
Timo Wolff, Berlin, DE;
Bruker Nano GmbH, Berlin, DE;
Abstract
The present disclosure refers to a handheld X-ray fluorescence, XRF, analyzer (). The XRF analyzer () comprises a radiation source assembly () configured to irradiate a sample () to be tested with an X-ray beam (), a radiation detector assembly () configured to detect a first X-Ray fluorescence, XRF, radiation () emitted from the sample () in response to the X-ray beam (), a purge assembly configured for purging through a port connection, a magnet () configured to deflect electrons such that they do not reach the radiation detector assembly () and a processor configured to determine a property of the sample () to be tested from the first X-ray fluorescence, XRF, radiation (). The present disclosure further refers to a method for elemental analysis with a handheld XRF analyzer ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile