The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Jan. 24, 2022
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventor:

Masahiro Yano, Naka, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C22C 26/00 (2006.01);
U.S. Cl.
CPC ...
C22C 26/00 (2013.01); C22C 2026/005 (2013.01); C22C 2026/007 (2013.01); C22C 2026/008 (2013.01);
Abstract

A cBN sintered compact includes a binder phase that contains a Ti—Al alloy containing at least one of the Si, Mg, and Zn elements, TiCN, TiB, AlN, and AlO; the ratio I/Iis 2.0 or more and 30.0 or less, wherein Irepresents the intensity of the TiCN peak appearing at 2θ from 41.9° to 42.2° and Irepresents the intensity of the Ti—Al alloy peak appearing at 2θ from 39.0° to 39.3° in XRD; and, in the mapped image of each element of Ti, Al, Si, Mg, and Zn by Auger electron spectroscopy, the ratio S/S, is 0.05 or more and 0.98 or less wherein Srepresents the average area of the portions wherein Ti, Al and at least one selected from the group consisting of Si, Mg, and Zn overlap and Srepresents the average area of the portions where Ti and Al overlap.


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Yano, Masahiro. (2026). Cbn sintered compact (U.S. Patent No. 12781315). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12781315

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