The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Sep. 28, 2022
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Jeremy D. Ecton, Gilbert, AZ (US);

Brandon C. Marin, Gilbert, AZ (US);

Srinivas Venkata Ramanuja Pietambaram, Chandler, AZ (US);

Oladeji Fadayomi, Maricopa, AZ (US);

Oscar Ojeda, Chandler, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B81B 7/00 (2006.01); B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
B81B 7/0006 (2013.01); B81C 1/00095 (2013.01); B81C 1/00523 (2013.01); B81C 1/00611 (2013.01); B81B 2207/07 (2013.01); B81C 2201/0123 (2013.01);
Abstract

Disclosed herein are microelectronics package architectures having self-aligned air gaps and methods of manufacturing the same. The microelectronics packages may include first and second substrates, first and second traces, and a photosensitive material. The first trace may be attached to the first substrate and comprise a first sidewall. The second trace may be attached to the first substrate and comprise a second sidewall. The second traced may be spaced a distance from the first trace with the second sidewall facing the first sidewall. First and second portions of the photosensitive material may be attached to the first and second sidewalls, respectively. The second substrate may be attached to the first and second traces. The first and second substrates and the first and second traces may form the air gap in between the first and second traces.


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Ecton, Jeremy. (2026). Self-aligned air gap formation in microelectronics packages (U.S. Patent No. 12780648). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12780648

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