Cutting tool inspection apparatus and method

Abstract

The cutting tool inspection apparatus includes a data collection unit, a training data generation unit, and an inspection data generation unit. The data collection unit acquires waveform data of current for one batch supplied to a motor that drives a cutting tool of a machine tool. During generation of training data to be compared with inspection data of the cutting tool, the training data generation unit infers a time range corresponding to a specific process of the machine tool, based on characteristics of the waveform data, and clips waveform data of the time range as the training data. The inspection data generation unit clips, as the inspection data, waveform data at a time position identical to a time position of the time range inferred by the training data generation unit, from the waveform data acquired by the data collection unit during inspection of the cutting tool.