The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Jul. 18, 2022
Eos Gmbh Electro Optical Systems, Krailling, DE;
Peter Holfelder-Schwalme, Saal an der Donau, DE;
Susanne Junghans, Munich, DE;
EOS GMBH ELECTRO OPTICAL SYSTEMS, Krailling, DE;
Abstract
Disclosed is a method and a device for determining property values of a segment of a manufacturing product made by an additive manufacturing process. In the process, a parameter set is determined which includes a defined group of process parameter values for the construction process of a layer of the segment. At least one process parameter value comprises a layer scanning direction arrangement. Furthermore, a segment scanning direction distribution is determined for the construction process of the segment. A macro property value of the segment is determined based on the parameter set and the segment scanning direction distribution. The invention additionally relates to a method for testing a manufacturing product, to a control data generation device, to a control device for a production device, and to a production device. The invention also relates to a method for setting up a basic property database and to a property database system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile