The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Dec. 20, 2023
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Jaemin Han, Portland, OR (US);

Dawei Ying, Portland, OR (US);

Leifeng Ruan, Beijing, CN;

Richard Burbidge, Shrivenham, GB;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01);
Abstract

This disclosure describes systems, methods, and devices related to enhanced measurement reporting. The device may generate radio access network (RAN) measurement parameters to configure an E2 node in Open Radio Access Network (O-RAN). The device may transmit an action definition to the E2 node through an E2 interface, wherein the action definition comprises a measured value reporting conditions information element (IE) based on the RAN measurement parameters, indicating to the E2 node to generate measurement reports. The device may identify the measurement reports received from the E2 node.


Find Patent Forward Citations

Han, Jaemin. (2026). Measurement reporting efficiency enhancement (U.S. Patent No. 12777352). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12777352

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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