The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Jun. 19, 2024
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Ancha Harihara Sravan, Bangalore, IN;

Yosuke Kato, Yokohama, JP;

Henry Chin, Fremont, CA (US);

Erika Penzo, San Jose, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/04 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3481 (2013.01); G11C 16/0483 (2013.01); G11C 16/26 (2013.01); G11C 16/3459 (2013.01);
Abstract

A memory apparatus is provided and includes memory cells configured to retain a threshold voltage corresponding to data states. The memory cells are disposed in memory holes each connected to bit lines. Each of the bit lines is coupled to one of a plurality of sense amplifiers arranged in tiers. A control means is configured to program the memory cells in each of a plurality of program iterations of a program operation. The control means counts a failure quantity of a group of the memory cells having the threshold voltage below one of a plurality of verify voltages associated with one of the data states targeted for the memory cells in each of a plurality of verify iterations of a program operation. The count is a coarse count not separately counting the memory cells coupled with ones of the plurality of sense amplifiers of one or more of the tiers.


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Sravan, Ancha. (2026). Program time improvement for nand die with coarse bitscan during program-verify (U.S. Patent No. 12776381). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12776381

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