The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jun. 22, 2023
Applicant:

Globalwafers Co., Ltd., Hsinchu City, TW;

Inventor:

Jia-Zhe Liu, Hsinchu City, TW;

Assignee:

GLOBALWAFERS CO., LTD., Hsinchu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H10D 30/01 (2025.01); H10D 30/47 (2025.01); H10D 62/10 (2025.01); H10D 62/85 (2025.01); H10H 20/01 (2025.01); H10H 20/815 (2025.01); H10H 20/825 (2025.01);
U.S. Cl.
CPC ...
H10H 20/815 (2025.01); H10D 30/015 (2025.01); H10D 30/475 (2025.01); H10D 62/10 (2025.01); H10D 62/8503 (2025.01); H10H 20/01335 (2025.01); H10H 20/0137 (2025.01); H10H 20/825 (2025.01);
Abstract

A method for epitaxy of a high electron mobility transistor includes: provide a substrate; form a nucleation layer on the substrate; form a buffer layer on the nucleation layer; form a first nitride layer being in contact with the buffer layer on the buffer layer; form a second nitride layer being in contact with the first nitride layer on the first nitride layer, and perform carbon doping on the second nitride layer; form a channel layer on the second nitride layer; and form a barrier layer on the channel layer; a two-dimensional electron gas is formed in the channel layer along an interface between the channel layer and the barrier layer; a growth temperature of the second nitride layer is less than a growth temperature of the first nitride layer; a film thickness of the first nitride layer is less than a film thickness of the second nitride layer.


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Liu, Jia-Zhe. (2026). Method for epitaxy of high electron mobility transistor (U.S. Patent No. 12772611). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12772611

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