The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Oct. 16, 2024
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventor:

Yohei Matsumoto, Iwate, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32174 (2013.01); H01J 37/32146 (2013.01); H01J 37/32155 (2013.01); H01J 37/3244 (2013.01); H01J 2237/332 (2013.01);
Abstract

A plasma control method includes: providing a plasma processing apparatus including a control unit and a process unit, receiving an input of a recipe in which values of a plurality of parameters are set for each processing step; determining a value of a variable parameter based on a progress state of the film forming processing when the plurality of parameters of the recipe include the variable parameter; and performing a film forming processing in the process unit based on the values of the plurality of parameters set in the recipe and the determined value of the variable parameter determined in the determining.


Find Patent Forward Citations

Matsumoto, Yohei. (2026). Plasma control method, plasma processing apparatus and plasma processing system (U.S. Patent No. 12770826). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12770826

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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