The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Nov. 24, 2021
Jx Advanced Metals Corporation, Tokyo, JP;
Katsushi Aoki, Hitachi, JP;
Hiroshi Kawano, Tokyo, JP;
JX ADVANCED METALS CORPORATION, Tokyo, JP;
Abstract
Provided is a method for processing electrical and electronic component scraps and an apparatus for processing electrical and electronic component scraps that can more efficiently sort out desired component scraps from electrical and electronic component scraps using an image recognition processing technique and a sorting device. A method for processing electrical and electronic component scraps including a sorting condition determining step Sof determining a sorting condition of electrical and electronic component scraps. This step includes an image recognition processing step Sof recognizing component scraps belonging to a specific component type from a plurality of captured image of the electrical and electronic component scraps including a plurality of component scraps by image recognition processing and acquiring image recognition information including information on a score representing a certainty of recognized component scraps, a detected area, and a number; a classification step Sof creating classification information classifying the number of recognized component scraps by using the image recognition information; and a condition determining step Sof determining a score threshold of the image recognition process and a detected area threshold of the component scraps based on the classification information and a processing capacity information of a sorting device sorting the component scraps.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile