The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Oct. 04, 2023
Mediatek Inc., Hsin-Chu, TW;
Yu-Lin Yang, Hsinchu City, TW;
Chin-Wei Lin, Hsinchu City, TW;
PO-Chao Tsao, Hsinchu City, TW;
Tung-Hsing Lee, Hsinchu City, TW;
Chia-Jung Ni, Hsinchu City, TW;
Chi-Ming Lee, Hsinchu City, TW;
Yi-Ju Ting, Hsinchu City, TW;
MEDIATEK INC., Hsinchu City, TW;
Abstract
An outlier IC detection method includes acquiring first measured data of a first IC set, training the first measured data for establishing a training model, acquiring second measured data of a second IC set, generating predicted data of the second IC set by using the training model according to the second measured data, generating a bivariate dataset distribution of the second IC set according to the predicted data and the second measured data, acquiring a predetermined Mahalanobis distance on the bivariate dataset distribution of the second IC set, and identifying at least one outlier IC from the second IC set when at least one position of the at least one outlier IC on the bivariate dataset distribution is outside a range of the predetermined Mahalanobis distance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile