logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12761012 B1

PDFFull Text
Date of Patent:
Oct. 13, 2026

Filed:

Mar. 28, 2024

Measuring parallelism

Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Minhwan Seo, Suwon-si, KR;

Jiyoung Chu, Suwon-si, KR;

Hyungjin Kim, Suwon-si, KR;

Sangwoo Bae, Suwon-si, KR;

Seungyeol Oh, Suwon-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Attorney:

Fish & Richardson P.C.

Primary Examiner:

Tarifur R Chowdhury

Assistant Examiner:

Kaitlyn E Kidwell

Int. Cl.
CPC ...
G01B 9/02015 (2022.01); G01B 9/02001 (2022.01); G01B 11/26 (2006.01); G01B 11/27 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01); G02B 27/10 (2006.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02016 (2013.01); G01B 9/02011 (2013.01); G01B 11/26 (2013.01); G01B 11/272 (2013.01); G02B 21/0016 (2013.01); G02B 21/0092 (2013.01); G02B 21/361 (2013.01); G02B 27/10 (2013.01); G02B 27/28 (2013.01); G01B 2210/46 (2013.01); G02B 27/283 (2013.01); G02B 27/286 (2013.01);
Abstract

A parallelism measurement optical system module includes a polarization beam splitter, a mirror positioned on a first surface of the polarization beam splitter, a first quarter wave plate positioned on a second surface of the polarization beam splitter that is perpendicular to the first surface, and a second quarter wave plate positioned on a third surface of the polarization beam splitter that is perpendicular to the first surface and parallel to the second surface.

Find Patent Forward Citations

Seo, Minhwan. (2026). Measuring parallelism (U.S. Patent No. 12761012). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761012

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…