The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Mar. 23, 2023
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventor:

Hiroshi Marumoto, Koshi City, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 72/00 (2026.01); B08B 3/02 (2006.01); B08B 13/00 (2006.01); G06T 7/00 (2017.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
H10P 72/06 (2026.01); B08B 3/022 (2013.01); B08B 13/00 (2013.01); G06T 7/0008 (2013.01); G06T 7/50 (2017.01); H10P 72/0404 (2026.01); G06T 2207/30148 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A substrate processing apparatus includes an inspection substrate including a base and an imaging unit disposed at the base; a holder configured to hold a substrate or the inspection substrate; a driving unit configured to rotate the holder; a processing liquid supply having a nozzle configured to discharge a processing liquid to the substrate held by the holder; and a controller. The controller is configured to perform: adjusting a position of the imaging unit with respect to the nozzle to a predetermined first imaging position by controlling the driving unit to rotate the holder in a state that the inspection substrate is held by the holder; and imaging, after the adjusting of the position of the imaging unit to the first imaging position, the nozzle at the first imaging position by controlling the imaging unit.


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