The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

May. 01, 2024
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Takeshi Kobayashi, Kanagawa, JP;

Keisuke Takizawa, Kanagawa, JP;

Hirofumi Suganuma, Kanagawa, JP;

Ikuya Otani, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/391 (2015.01);
U.S. Cl.
CPC ...
H04B 17/3912 (2015.01);
Abstract

A test system includes an actual propagation path characteristic calculation unit that calculates estimation characteristics, at analysis target timings, of propagation path characteristics of channels constituting an actual propagation path, a channel model parameter calculation unit that calculates channel model parameters characterizing statistical properties of the estimation characteristics, a simulation propagation path characteristic generation unit that generates simulation propagation path characteristics according to the channel model parameters, a simulation channel capacity calculation unit that calculates a channel capacity of the simulation propagation path characteristics, an actual propagation path channel capacity calculation unit that calculates a channel capacity of the estimation characteristics at some analysis target timings among the analysis target timings, and a channel capacity evaluation unit that calculates an evaluation indicator for evaluating a degree of similarity between the channel capacity of the simulation propagation path characteristics and the channel capacity of the estimation characteristics.


Find Patent Forward Citations

Kobayashi, Takeshi. (2026). Test system and evaluation method (U.S. Patent No. 12756488). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12756488

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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