The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Mar. 27, 2024
Zhejiang Hengyi Petrochemical Co., Ltd., Hangzhou, CN;
Zhejiang Hengyi High-tech Materials Co., Ltd., Hangzhou, CN;
Xiantao Peng, Hangzhou, CN;
Peng Wang, Hangzhou, CN;
Dake Li, Hangzhou, CN;
Yaobin Zhang, Hangzhou, CN;
Huitao Fan, Hangzhou, CN;
Feng Xu, Hangzhou, CN;
ZHEJIANG HENGYI PETROCHEMICAL CO., LTD., Hangzhou, CN;
ZHEJIANG HENGYI HIGH-TECH MATERIALS CO., LTD., Hangzhou, CN;
Abstract
Provided is a method for processing sample data, an electronic device and a storage medium, relating to the field of artificial intelligence technology, and especially to the fields of image processing and computer vision. The method includes: obtaining a plurality of first working images of a spinning box; for each first working image in the plurality of first working images, determining the first working image as a defect image of the spinning box when a difference between the first working image and a normal image of the spinning box meets a first condition; and obtaining a first sample data set based on all defect images in the plurality of first working images.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile