The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Jan. 10, 2025
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Yang Lu, Boise, ID (US);

Donald Morgan, Meridian, ID (US);

Qiaohua Dong, Atlanta, GA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/406 (2006.01);
U.S. Cl.
CPC ...
G11C 11/40603 (2013.01); G11C 11/40615 (2013.01);
Abstract

Apparatuses and techniques for performing serialized update procedures during a refresh period are described. In example aspects, a memory device performs a normal refresh operation, which refreshes multiple rows simultaneously. The refreshed rows are associated with different refresh sections and different column segments. While refreshing the rows and prior to an end of a refresh cycle time (tRFC), the memory device updates, in a serialized manner, usage-based-disturbance data that is stored within the refreshed rows. In particular, the memory device performs, in series, multiple update procedures, which overwrites values of the usage-based-disturbance data that are stored within the refreshed rows. For example, the multiple update procedures can set values of activation counts that are stored within the refreshed rows to a predetermined value. By performing the multiple update procedures in series, the memory device can utilize appropriate column repair solutions to access the usage-based-disturbance data and avoid a potential conflict on global input/output (GIO) lines.


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