The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Nov. 17, 2021
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Longwei Fang, Beijing, CN;
Yikai Fang, Beijing, CN;
Hongzhi Tao, Beijing, CN;
Qiang Li, Beijing, CN;
Hang Zheng, Beijing, CN;
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 7/246 (2017.01); G06T 7/292 (2017.01); G06T 7/73 (2017.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G06T 7/251 (2017.01); G06T 7/292 (2017.01); G06T 7/75 (2017.01); G06T 19/20 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30221 (2013.01); G06T 2219/2004 (2013.01);
Abstract
A method and system of multi-view image processing with accurate skeleton reconstruction uses joint confidence values.
Fang, Longwei. (2026). Method and system of multi-view image processing with accurate skeleton reconstruction (U.S. Patent No. 12749263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12749263
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile