The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Jun. 27, 2022
Applicant:

Helsingin Yliopisto, Helsingin yliopisto, FI;

Inventors:

Ari Salmi, Helsinki, FI;

Axi Holmström, Helsingin yliopisto, FI;

Joni Mäkinen, Helsingin yliopisto, FI;

Petri Lassila, Helsingin yliopisto, FI;

Jere Hyvönen, Helsingin yliopisto, FI;

Tom Sillanpää, Helsingin yliopisto, FI;

Tapio Kotiaho, Helsingin yliopisto, FI;

Antti Kuronen, Helsingin yliopisto, FI;

Edward Haeggström, Helsinki, FI;

Assignee:

HELSINGIN YLIOPISTO, Helsingin Yliopisto, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 2/00 (2006.01); H01J 49/04 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0459 (2013.01); H01J 49/165 (2013.01); H01J 49/0468 (2013.01);
Abstract

This relates to sampling systems, wherein the sampling is based on removal of material from a sample immersed in a fluid by cavitation induced by high-intensity focused ultrasound. The system includes also a feeding unit for transporting at least part of the removed material from the fluid to a detecting unit. The invention relates also to a method for feeding material from the sample to a detecting unit using the sampling system.


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