The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Aug. 29, 2021
Applicant:

Phison Electronics Corp., Miaoli, TW;

Inventors:

Yi-Hsiang MA, New Taipei City, TW;

Szu-Wei Chen, New Taipei City, TW;

Yu-Hung Lin, Miaoli County, TW;

An-Cheng Liu, Taipei City, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/2431 (2023.01); G06N 3/045 (2023.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/2431 (2023.01); G06N 3/045 (2023.01); G06T 5/50 (2013.01); G06T 2207/20224 (2013.01);
Abstract

A method for training an asymmetric generative adversarial network to generate an image and an electronic apparatus using the same are provided. The method includes the following. A first real image belonging to a first category, a second real image belonging to a second category and a third real image belonging to a third category are input to an asymmetric generative adversarial network for training the asymmetric generative adversarial network, and the asymmetric generative adversarial network includes a first generator, a second generator, a first discriminator and a second discriminator. A fourth real image belonging to the second category is input to the first generator in the trained asymmetric generative adversarial network to generate a defect image.


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