The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Oct. 07, 2021
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Naigeng Chen, San Jose, CA (US);

Stephan Lvovich Logunov, Corning, NY (US);

Weiwei Luo, Painted Post, NY (US);

Mark Alejandro Quesada, Horseheads, NY (US);

Bo Yang, Dublin, CA (US);

Assignee:

CORNING INCORPORATED, Corning, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 3/14 (2006.01); B23K 26/324 (2014.01); B23K 26/57 (2014.01); B23K 31/12 (2006.01); B23K 103/00 (2006.01); G02B 26/00 (2006.01);
U.S. Cl.
CPC ...
G02B 3/14 (2013.01); B23K 26/324 (2013.01); B23K 26/57 (2015.10); B23K 31/12 (2013.01); G02B 26/005 (2013.01); B23K 2103/54 (2018.08);
Abstract

A device comprising: a first substrate; and a second substrate bonded to the first substrate via an innermost bond, an outermost bond, and bonds between the innermost bond and the outermost bond, the second substrate comprising a through-hole and an axis extending through the through-hole. Each of the bonds has a strength, and the strength of the bonds increases sequentially from the innermost bond to the outermost bond. The strength of each bond is sufficiently low such that the bonds fail in response to liquid (within a cavity defined by the first substrate, a third substrate, and the through-hole of the second substrate) exerting pressure on the first substrate instead of the first substrate failing. Each of the bonds are configured to fail at approximately the same pressure exerted upon the first substrate by the liquid. Additionally disclosed is a method of manufacturing the device.


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