The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Dec. 04, 2020
Applicants:

Horiba, Ltd., Kyoto, JP;

Eppendorf Himac Technologies Co., Ltd., Hitachinaka-city, JP;

Inventors:

Tetsuji Yamaguchi, Kyoto, JP;

Yuki Shimizu, Hitachinaka-city, JP;

Ken Asakura, Hitachinaka-city, JP;

Assignees:

HORIBA, LTD., Kyoto, JP;

EPPENDORF HIMAC TECHNOLOGIES CO., LTD., Hitachinaka-City, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/04 (2006.01); G01N 15/0205 (2024.01);
U.S. Cl.
CPC ...
G01N 15/042 (2013.01); G01N 15/0205 (2013.01); G01N 2015/045 (2013.01);
Abstract

The present invention includes: a cell holding body that holds a measurement cell housing a measurement sample and a dispersion medium; a cover attached to the cell holding body so as to cover the measurement cell; a rotation section that rotates the cell holding body and applies centrifugal force to the measurement cell; a light source that is provided on one side of a rotation passage region of the measurement cell and irradiates the cell with light; a photodetector that is provided on another side of the rotation passage region of the measurement cell and detects light transmitted through the cell; and a particle diameter distribution arithmetic section that acquires a light intensity signal from the photodetector and calculates a particle diameter distribution. The rotation passage region of the cover is located inside an optical path of light passing between the light source and the photodetector.


Find Patent Forward Citations

Yamaguchi, Tetsuji. (2026). Centrifugal sedimentation-type particle diameter distribution measurement device (U.S. Patent No. 12736456). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12736456

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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