The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Aug. 22, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Wen Pan, Santa Clara, CA (US);

Yang Liu, Melissa, TX (US);

Seungjune Jeon, Santa Clara, CA (US);

Wei Wang, Dublin, CA (US);

Charles S. Kwong, Redwood City, CA (US);

Jiangli Zhu, San Jose, CA (US);

Juane Li, Milpitas, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/1016 (2013.01);
Abstract

A method for performing a media scan operation in a memory device is described herein. The method includes initiating the media scan operation via a controller. The method also includes selecting one or more codewords that is a proper subset of a plurality of codewords in a page of memory via the controller. The method also includes determining a bit error count (BEC) of each of the one or more codewords via the controller. The method also includes comparing the BEC of each of the one or more codewords with a BEC threshold via the controller. The method further includes determining the BEC of each of the codewords of the page of memory via the controller in response to the BEC of one or more of the selected set of codewords being greater than the BEC threshold.


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