The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jan. 24, 2024
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Takashi Iwase, Kanagawa, JP;

Yuki Kondo, Kanagawa, JP;

Chunqing Liang, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/02 (2010.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01S 5/021 (2013.01); G01R 35/005 (2013.01);
Abstract

To provide a measurement apparatus capable of simplifying a test configuration and reducing cost. A measurement apparatus includes a measurement unitthat measures an RF signal received from a DUT, a signal generation unitthat generates and transmits a test RF signal to be transmitted to the DUT, and a 1-PPS signal generation unitthat generates a 1-PPS signal for synchronization of transmission/reception timing between the measurement unit, the signal generation unit, and the DUT, and outputs the generated 1-PPS signal to each of the measurement unit, the signal generation unit, and the DUT


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