Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support

Abstract

A first profile associated with a first circuit may be obtained by running a first test (which may be a shmoo test) on the first circuit. Running the first test on the first circuit may include: selecting an operating condition for testing the first circuit, where the operating condition includes noise and voltage drop conditions to be used during testing; selecting a set of circuits in proximity to the first circuit based on the noise and voltage drop conditions; running built-in self-test (BIST) on the set of circuits to generate the noise and voltage drop conditions in the first circuit; running BIST on the first circuit while BIST is running on the set of circuits; determining a first result of running the BIST on the first circuit; and associating the first result with the operating condition.