The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Mar. 11, 2022
Applicant:

SK Enpulse Co., Ltd., Gyeonggi-do, KR;

Inventors:

Jong Wook Yun, Seoul, KR;

Eun Sun Joeng, Gyeonggi-do, KR;

Sung Hoon Yun, Seoul, KR;

Hye Young Heo, Gyeonggi-do, KR;

Jang Won Seo, Seoul, KR;

Assignee:

ENPULSE CO., LTD., Chungcheongnam-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 37/22 (2012.01); B24B 37/04 (2012.01); H10P 52/40 (2026.01);
U.S. Cl.
CPC ...
B24B 37/042 (2013.01); B24B 37/22 (2013.01); H10P 52/402 (2026.01);
Abstract

The present invention relates to a polishing pad, a method for producing the same, and a method of fabricating a semiconductor device using the same. According to the present invention, it is possible to prevent defects from occurring due to an inorganic component contained in a polishing layer during a polishing process, by limiting the content range of the inorganic component contained in the polishing layer. In addition, an unexpanded solid foaming agent is contained in a polishing composition for producing a polishing layer and is expanded during a curing process to form a plurality of uniform pores in the polishing layer, and the content range of the inorganic component contained in the polishing layer, thereby preventing defects from occurring during the polishing process.


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