The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jun. 26, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Wei Wang, Fremont, CA (US);

Seungjune Jeon, Santa Clara, CA (US);

Yang Liu, San Jose, CA (US);

Charles See Yeung Kwong, Redwood City, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01); G11C 16/04 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3431 (2013.01); G11C 16/0483 (2013.01);
Abstract

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising identifying one or more valid pages of a first block, the first block being associated with a first management unit of the memory device; responsive to determining that a data integrity metric value associated with the first block satisfies a threshold criterion, causing the memory device to copy data from the one or more valid pages to a destination set of pages associated with a second block of a second management unit; marking each page of the one or more valid pages as invalid; and performing an error correcting operation, using one or more invalid pages of the first block, on a third block of the first management unit.


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