The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jul. 27, 2021
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventor:

Isao Yokokawa, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/762 (2006.01); C23C 16/40 (2006.01); C23C 16/56 (2006.01); H10P 90/00 (2026.01); H10W 10/10 (2026.01);
U.S. Cl.
CPC ...
H10P 90/1914 (2026.01); C23C 16/401 (2013.01); C23C 16/56 (2013.01); H10W 10/181 (2026.01);
Abstract

A method for manufacturing an SOI wafer including: a step of forming a silicon oxide film by thermal oxidation on an entire surface of a base wafer containing a dopant; and bonding a main surface of a bond wafer to a first main surface via the silicon oxide film, wherein, prior to the thermal oxidation step, a step of forming a CVD insulator film on a second main surface; and a step of forming, on the first main surface, a barrier silicon layer containing a dopant at a lower concentration than a dopant concentration of the base wafer, and in the thermal oxidation step, the barrier silicon layer is thermally oxidized to produce a barrier silicon oxide film, and in the bonding step, the bond wafer is bonded to the base wafer via the barrier silicon oxide film as a part of the silicon oxide film.


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