The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jan. 21, 2021
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Tokutarou Hayashi, Kikuchi gun, JP;

Yoshitaka Otsuka, Koshi, JP;

Yasutaka Mizomoto, Kikuchi-gun, JP;

Kazuya Ikeue, Kikuchi-gun, JP;

Munehisa Kodama, Kikuchi-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 41/00 (2006.01); H10P 72/00 (2026.01); H10P 72/50 (2026.01); H10P 74/20 (2026.01);
U.S. Cl.
CPC ...
H10P 72/0604 (2026.01); H10P 72/0428 (2026.01); H10P 72/50 (2026.01); H10P 74/203 (2026.01);
Abstract

A bonding apparatus is configured to bond a first substrate and a second substrate to prepare a combined substrate. The first substrate includes a base substrate, and a device layer formed on a surface of the base substrate facing the second substrate. The bonding apparatus includes a first holder configured to hold the first substrate; a second holder configured to hold the second substrate; a moving unit configured to move the first holder and the second holder relative to each other; and a total thickness measurement controller configured to control a thickness detector, which is configured to measure a total thickness of the combined substrate, to measure the total thickness at multiple points.


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