The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Nov. 15, 2022
Applicant:

Micron Technology, Inc., Boise, CA (US);

Inventors:

Eric N. Lee, San Jose, CA (US);

Luyen Vu, San Jose, CA (US);

Lawrence Celso Miranda, San Jose, CA (US);

Jeffrey Ming-Hung Tsai, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3459 (2013.01); G11C 16/102 (2013.01); G11C 16/26 (2013.01);
Abstract

Control logic in a memory device initiates a loop of a program operation comprising (a) a program phase where a plurality of memory cells associated with a selected wordline in a block of the memory array are programmed to respective programming levels and (b) a corresponding program verify phase. The control logic further identifies memory cells associated with a first sub-set of programming levels to be verified during the program verify phase, the first sub-set comprising two or more dynamically selected programming levels comprising at least a lowest programming level and a second lowest programing level. The control logic further performs concurrent sensing operations on the identified memory cells during the program verify phase to determine whether the identified memory cells were programmed to respective program verify threshold voltages corresponding to the first sub-set of the plurality of programming levels during the program phase.


Find Patent Forward Citations

Lee, Eric. (2026). Program verify pairing in a multi-level cell memory device (U.S. Patent No. 12706163). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12706163

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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