The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Nov. 22, 2024
Microchip Technology Incorporated, Chandler, AZ (US);
Nian Niles Yang, Mountain View, CA (US);
Pitamber Shukla, San Jose, CA (US);
Ramyakanth Edupuganti, San Jose, CT (US);
Microchip Technology Incorporated, Chandler, AZ (US);
Abstract
A method of detecting an over-programming of a memory cell during a write operation in a non-volatile memory media of a solid-state drive, and a solid-state drive with over-programming detection. When data is written to the states of the memory cell, a current last bit is routinely or selectively checked to detect an over-programming condition of the current state. An over-programming verification level may be used to check the current last bit and may be between zero and twenty-five millivolts lower than a regular programming verification level for a next first bit of the next state. When the over-programming condition is not detected, the program operation continues to write data to the next state. When the over-programming condition is detected, either the over-programmed current last bit is identified and the program operation is adjusted, or a memory block in which the over-programmed current last bit is located is retired.