The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Oct. 28, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventor:

Shahaji B. More, Hsinchu City, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10P 14/20 (2026.01); H10D 84/01 (2026.01); H10D 84/03 (2025.01); H10P 30/20 (2026.01); H10P 50/64 (2026.01);
U.S. Cl.
CPC ...
H10P 14/3822 (2026.01); H10D 84/0188 (2025.01); H10D 84/0193 (2025.01); H10D 84/038 (2025.01); H10P 14/274 (2026.01); H10P 14/3411 (2026.01); H10P 30/204 (2026.01); H10P 30/21 (2026.01); H10P 50/642 (2026.01);
Abstract

Implementations described herein provide a method that includes implanting a dopant and carbon in a portion of a substrate of a semiconductor device. The method also includes depositing a first silicon-based layer on the portion of the substrate, the first silicon-based layer reacting with the carbon to form a diffusion region on the portion of the substrate. The method further includes forming a recessed portion of the semiconductor device, the recessed portion extending through the first silicon-based layer and the diffusion region and partially extending into the portion of the substrate. The method additionally includes depositing a second silicon-based layer within the recessed portion. The method further includes etching one or more portions of the second silicon-based layer and the portion of the substrate to form a set of fin structures that include the second silicon-based layer and the portion of the substrate having the dopant and the carbon implanted.


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