The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jul. 03, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Michael Dieter Richter, Ottobrunn, DE;

Thomas Hein, Munich, DE;

Casto Salobrena Garcia, Munich, DE;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/14 (2026.01);
U.S. Cl.
CPC ...
G06F 11/1056 (2013.01); G06F 11/141 (2013.01);
Abstract

Methods, systems, and devices for maintaining integrity of configuration data for memory devices are described. A memory system may implement an error control component configured to detect errors in configuration data stored to one or more mode registers. The error control component may be configured to generate error control information, including one or more parity bits or a checksum, associated with the configuration data. The memory system or a host system coupled with the memory system may be configured to detect errors in the configuration data based on the error control information. Based on detecting the errors, the memory system may enter a safe mode, in which the memory system refrains from performing access operations until the configuration data is rewritten to the one or more mode registers.


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