The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Aug. 17, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Meng Wei, Shanghai, CN;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/0634 (2013.01); G06F 3/0656 (2013.01); G06F 3/0679 (2013.01);
Abstract

A power loss protection failure is detected at a memory device. Based on detecting the power loss protection failure, a count of unused entries in a journal buffer is determined. A host command is received, and a number of entries needed to record the host command to the journal buffer is determined. In response to determining the count of unused entries in the journal buffer includes a least the number of entries needed to record the host command to the journal buffer, the host command is recorded in the journal buffer and the count of unused entries is reduced by the number of entries needed to record the host command to the journal buffer.


Find Patent Forward Citations

Wei, Meng. (2026). Atomicity assurance in write through mode (U.S. Patent No. 12699517). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12699517

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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