The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jan. 18, 2023
Applicant:

Hexagon Innovation Hub Gmbh, Heerbrugg, CH;

Inventors:

Petri Lehtonen, Tampere, FI;

Lukas Scheer, Tampere, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01);
Abstract

An arrangement for optically measuring the surface, such as surface shape and/or associated surface defects, of an optionally glossy target object, comprising: a diffusive, semi-transparent illumination structure defining a hollow, preferably curved, elongated surface shape, constituting a tunnel shape, configured to surround at least one target object at least partially, a number of LED (light-emitting diode) light sources optically coupled to the illumination structure for illuminating at least one target object via the surface of the illumination structure, wherein the light sources are situated at a distance from the surface of the illumination structure, wherein the LED light sources are arranged in a matrix array along the curvilinear cross-section of the illumination structure and along the length of the tunnel shape of the illumination structure, at least one imaging device, configured to image the target object.


Find Patent Forward Citations

Lehtonen, Petri. (2026). Arrangement for optical measurements and related method (U.S. Patent No. 12698961). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12698961

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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