The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Feb. 07, 2020
Applicant:

Bondtech Co., Ltd., Kyoto, JP;

Inventor:

Akira Yamauchi, Kyoto, JP;

Assignee:

BONDTECH CO., LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 25/075 (2006.01);
U.S. Cl.
CPC ...
H01L 24/80 (2013.01); H01L 24/05 (2013.01); H01L 24/08 (2013.01); H01L 24/74 (2013.01); H01L 25/0753 (2013.01); H01L 2224/05578 (2013.01); H01L 2224/05647 (2013.01); H01L 2224/05687 (2013.01); H01L 2224/0569 (2013.01); H01L 2224/08225 (2013.01); H01L 2224/80123 (2013.01); H01L 2224/8013 (2013.01); H01L 2224/80132 (2013.01); H01L 2224/80203 (2013.01); H01L 2224/8083 (2013.01); H01L 2224/80874 (2013.01); H01L 2224/80893 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01); H01L 2224/80907 (2013.01); H01L 2224/80908 (2013.01); H01L 2224/80986 (2013.01); H01L 2924/12041 (2013.01); H01L 2924/35121 (2013.01); H01L 2924/3656 (2013.01);
Abstract

A bonding device measures a position deviation amount of the chip with respect to the substrate in a state where the chip and the substrate are in contact, and corrects and moves the chip relatively to the substrate in such a way as to reduce the position deviation amount, based on the measured position deviation amount. Then, the bonding device fixes the chip to the substrate by irradiating a resin portion of the chip with an ultraviolet ray and curing the resin portion when the position deviation amount of the chip with respect to the substrate is equal to or less than a position deviation amount threshold value.


Find Patent Forward Citations

Yamauchi, Akira. (2026). Bonding method, bonded article, and bonding device (U.S. Patent No. 12696799). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12696799

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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