The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Sep. 21, 2023
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Nicolas Louis Breil, San Jose, CA (US);

Abhijit B. Mallick, Fremont, CA (US);

Balasubramanian Pranatharthiharan, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 14/692 (2026.01); H10W 20/00 (2026.01);
U.S. Cl.
CPC ...
H10P 14/69215 (2026.01); H10W 20/056 (2026.01); H10W 20/081 (2026.01);
Abstract

Embodiments of the present disclosure are provide a method for fabricating a semiconductor device with fewer via voids (e.g., gaps between a dielectric layer and a metal fill of the semiconductor device). One such technique involves forming a dielectric layer, wherein at least a portion of the dielectric layer comprises a nonstoichiometric compound; forming one or more openings in the dielectric layer; filling the one or more openings with a metal, wherein the metal is disposed on a surface of each of the one or more openings; and exposing the dielectric layer and metal disposed in the openings to an oxidizing atmosphere, wherein exposing the dielectric layer and metal in the openings causes oxidation of the nonstoichiometric compound.


Find Patent Forward Citations

Breil, Nicolas. (2026). Middle of line dielectric layer engineering for via void prevention (U.S. Patent No. 12696698). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12696698

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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