The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jun. 21, 2024
Applicant:

Disco Corporation, Tokyo, JP;

Inventor:

Makoto Kobayashi, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01); G01N 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 3/20 (2013.01); G01N 3/02 (2013.01);
Abstract

A test apparatus includes a support base that supports an undersurface of a chip, a pressing unit that presses the chip supported by the support base, and a load measuring instrument that measures a load applied when the pressing unit presses the chip. The pressing unit includes a first test indenter that performs a three-point bending test by pressing the chip supported by the support base and a second test indenter that performs a four-point bending test by pressing the chip supported by the support base, and the first test indenter and the second test indenter are configured to be selectable when the chip supported by the support base is pressed by the pressing unit.


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