The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Jul. 13, 2023
Applicants:

Kyushu University, National University Corporation, Fukuoka, JP;

Gigaphoton Inc., Tochigi, JP;

Inventors:

Hiroshi Ikenoue, Fukuoka, JP;

Akira Mizutani, Oyama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10P 72/00 (2026.01); G06N 3/08 (2023.01); H10P 34/42 (2026.01); H10P 72/76 (2026.01);
U.S. Cl.
CPC ...
H10P 72/0436 (2026.01); G06N 3/08 (2013.01); H10P 34/42 (2026.01); H10P 72/7618 (2026.01);
Abstract

A machine learning method includes acquiring image data generated from reflected light of illumination light radiated to a first region of a semiconductor film on a substrate, the first region annealed by pulse laser light, acquiring data on a measured semiconductor property of the first region, generating training data including the image data as input and the measured data as output associated with each other, and performing machine learning using a neural network based on the training data to generate a learned model.


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