The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Jun. 15, 2023
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Guy Wolfovitz, Haifa, IL;

Ramanuj Chouksey, Noida, IN;

Amit Verma, Noida, IN;

Habeeb Anton Farah, Haifa, IL;

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3323 (2020.01); G06F 30/337 (2020.01); G06F 119/16 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3323 (2020.01); G06F 30/337 (2020.01); G06F 2119/16 (2020.01);
Abstract

A solution for performing incremental mutation coverage testing is disclosed. The solution can identify, for a cycle of a test, a first signal not covered during preceding cycles of the test and select, for the current cycle, a first value for the first signal. The solution can, responsive to the first value, determine whether the first signal is covered by the test in the current cycle and identify whether a first assertion not covered during the one or more preceding cycles is covered in the current cycle. The solution can remove the first signal from a list of signals if it determines that it is not covered by the test and remove the first assertion from a list of assertions if the first assertion is determined to be covered. The system can identify, for a next cycle, a second signal from the updated one or more signals for the circuit.


Find Patent Forward Citations

Wolfovitz, Guy. (2026). Method and apparatus for mutation coverage testing with incremental sat queries (U.S. Patent No. 12688346). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12688346

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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