The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jun. 11, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chin I Wang, Tainan, TW;

Huan-Chieh Chen, Taichung, TW;

Chia-Wen Zhong, Taichung, TW;

Yao-Wen Chang, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10N 70/00 (2023.01); H10B 63/00 (2023.01);
U.S. Cl.
CPC ...
H10N 70/8828 (2023.02); H10B 63/20 (2023.02); H10N 70/021 (2023.02); H10N 70/063 (2023.02); H10N 70/066 (2023.02); H10N 70/821 (2023.02); H10N 70/8822 (2023.02); H10N 70/8825 (2023.02);
Abstract

Various embodiments of the present disclosure provide a memory device and methods of forming the same. In one embodiment, a memory device is provided. The memory device includes a substrate, a bottom electrode disposed over the substrate, a top electrode disposed over the bottom electrode, and a phase change layer disposed between the top electrode and the bottom electrode. The phase change layer is a laminated structure comprising a first layer of phase change material and a second layer of phase change material alternatingly stacked, and the first layer of phase change material is chemically different from the second layer of phase change material, wherein the first layer of phase change material has a first thickness that is less than a second thickness of the second layer of phase change material.


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