The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Mar. 20, 2023
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Seiya Kato, Kanagawa, JP;

Ryota Chinbe, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/06 (2009.01);
U.S. Cl.
CPC ...
H04W 24/06 (2013.01);
Abstract

There is provided a mobile terminal test system and a mobile terminal test method capable of greatly reducing a time required to a setting of a parameter for a plurality of test cases. A common parameter extraction unit that extracts parameters of the same type among a plurality of parameters included in a plurality of test cases selected by an operation unit as a plurality of common parameters, a display control unit that displays a list of plurality of common parameters extracted by the common parameter extraction unit on a display unit, a common parameter setting unit that collectively sets respective change values input by the operation unit to the plurality of common parameters, and a test execution unit that executes a test of the plurality of test cases by using the plurality of common parameters set by the common parameter setting unit are included.


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