The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Feb. 16, 2022
Applicant:

Kla Corporation, Milpitas, CA (US);

Inventors:

Kaushik Sah, Kessel Lo, BE;

Thirupurasundari Jayaraman, Chennai, IN;

Srikanth Kandukuri, Hyderabad, IN;

Andrew James Cross, Cheshire, GB;

Gangadharan Sivaraman, Chennai, IN;

Assignee:

KLA Corporation, Milpitas, CA (US);

Attorney:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/60 (2024.01); G16H 10/40 (2018.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 5/60 (2024.01); G16H 10/40 (2018.01); G16H 30/40 (2018.01); G06T 2207/20081 (2013.01);
Abstract

A system and method for enhancing image quality. The system and method acquire a machine learning model trained for correlating one or more training images and one or more training design images. The system and method receive one or more sample specimen images corresponding to one or more features of a sample specimen. The system and method enhance the one or more sample specimen images by generating one or more enhanced images with the machine learning model based on at least the one or more sample specimen images.


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