The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Aug. 27, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Chonggiap Chiew, Singapore, SG;

Sean Brasfield, Boise, ID (US);

Tawalin Opastrakoon, Boise, ID (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/064 (2013.01); G06F 3/0679 (2013.01);
Abstract

A method for managing data in a non-volatile memory system includes generating, by a randomizer integrated on a die of a memory device, padding data to close a memory block for a data write operation. The padding data is random data. The method includes programming, by a media controller of the memory device, the padding data into specified memory pages in a data block within the memory device. The data block stores user data for the data write operation and the padding data. The method includes executing, by a memory controller and by the media controller, a data integrity scan on a selected memory page of the specified memory pages of the data block. Execution of the data integrity scan includes re-generating, by the randomizer, the padding data and comparing the re-generated padding data with stored padding data sensed from the selected memory page to identify mismatch data.


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