The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jun. 06, 2023
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Ryota Takasu, Kanagawa, JP;

Taichi Murakami, Kanagawa, JP;

Kodai Ishida, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/3145 (2013.01);
Abstract

According to the present disclosure, an optical pulse test device includes an OTDR waveform measurement unit that measures an OTDR waveform with a plurality of pulse widths, an event analysis unit that calculates a level, a loss, and a return loss at a start point of each event, and an analysis result integration unit that calculates a cumulative loss at the start point and an end point of each event from the level, the loss, and the return loss at the start point of each event, determines a pulse width that enables securing of a required SN ratio or more for each of the start point and the end point of each event, integrates the cumulative loss at each of the start point and the end point of each event with the determined pulse width, and sets the integrated cumulative loss as an analysis result.


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