The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Aug. 29, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Peng Zhang, Los Altos, CA (US);

Murong Lang, San Jose, CA (US);

Zhenming Zhou, San Jose, CA (US);

Lei Lin, Freemont, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12005 (2013.01); G11C 2029/1202 (2013.01);
Abstract

A method for performing a media scan operation on a virtual block in a memory device is described herein. The method includes incrementing a first count value of a first read counter via a controller in response to a first read operation performed on a first fractional good block of the virtual block. The method also includes incrementing a second count value of a second read counter via the controller in response to a second read operation performed on a second fractional good block of the virtual block. The method also includes selecting one of the first and second fractional good blocks for the media scan operation via the controller based on a difference between the first and second count values. The method further includes performing the media scan operation on a wordline of the selected one of the first and second fractional good blocks via the controller.


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