The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Dec. 19, 2022
Applicant:

Ebara Corporation, Tokyo, JP;

Inventors:

Yosuke Nagasawa, Tokyo, JP;

Tensei Sato, Tokyo, JP;

Hideki Wakabayashi, Tokyo, JP;

Assignee:

EBARA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 21/12 (2006.01); C25D 17/00 (2006.01); C25D 21/10 (2006.01);
U.S. Cl.
CPC ...
C25D 21/12 (2013.01); C25D 17/001 (2013.01); C25D 21/10 (2013.01);
Abstract

The present disclosure provides a plating apparatus that can determine an acceleration at the time of an inappropriate deceleration of a transfer device that may cause contact between a substrate holder and a processing tank, a control method for a plating apparatus, and a storage medium storing a program. The plating apparatus according to the present disclosure includes a transfer device including an imaging device, the processing tank having an opening, a reference mark, and a control device, the control device is configured to be able to execute a test at a test acceleration, and the test includes: controlling, by the control device, the imaging device to capture a reference image when the transfer device is located at a determination position directly above the processing tank; moving the transfer device from a reference position to the determination position; controlling the imaging device to capture a comparison video when and after the transfer device stops; and determining, based on the reference image and the comparison video, whether the lower end portion of the substrate holder protrudes outside a region where the opening is extended in a vertical direction, to determine that the test acceleration has an inappropriate value when the lower end portion protrudes outside the region.


Find Patent Forward Citations

Nagasawa, Yosuke. (2026). Plating apparatus, control method for plating apparatus and nonvolatile storage medium storing program (U.S. Patent No. 12674248). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12674248

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