The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Jul. 17, 2024
Fanuc Corporation, Yamanashi, JP;
Hsien-Chung Lin, Fremont, CA (US);
Yutarou Momosaki, Yamanashi, JP;
Tetsuaki Kato, Fremont, CA (US);
FANUC CORPORATION, Yamanashi, JP;
Abstract
An object interference checking technique using collision maps. A CAD model of a workpiece is converted to an obstacle height map defining obstacle height above a reference plane for each cell of a grid. A CAD model of a tool is used to construct a tool height map. The obstacle height map and the tool height map are used to generate a collision map defining a collision-free tool height above each grid cell of the collision map. The collision map is generated by scanning the tool height map over the obstacle height map and, for each scan point, determining a height of the tool height map which results in no interferences between any pixel of the tool height map and a corresponding pixel of the obstacle height map. A collision check of a tool trajectory is then performed by comparing trajectory check points to grid cells of the collision map.