The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Sep. 26, 2024
Applicant:

Winbond Electronics Corp., Taichung, TW;

Inventors:

Chien-Min Wu, Taichung City, TW;

Shao-Ching Liao, Taichung City, TW;

Kuang-Chih Hsieh, Taichung City, TW;

Assignee:

Winbound Electronics Corp., Taichung City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/46 (2006.01); G11C 29/12 (2006.01); G11C 29/38 (2006.01);
U.S. Cl.
CPC ...
G11C 29/46 (2013.01); G11C 29/12005 (2013.01); G11C 29/38 (2013.01);
Abstract

A method and an apparatus for memory testing are provided. The method includes following steps: after multiple dies are idle for a first time, performing a first stage test on the dies, and setting multiple flags corresponding to the dies that fail the first stage test to a first logic level; after the dies are idle for a second time, performing a second stage test on the dies, and regarding the dies that pass the second stage test and have the corresponding flags set to the first logic level as suspected good dies and keeping the suspected good dies idle; and after the suspected good dies are idle for a third time, performing a third stage test on the suspected good dies.


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