The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Sep. 10, 2024
Micron Technology, Inc., Boise, ID (US);
Yi Lin Lai, New Tai, TW;
Jen Hung Liao, Zhubei City, TW;
Wai Leong Chin, Singapore, SG;
Pin Hsueh Lai, New Taipei City, TW;
Edric Goh, Singapore, SG;
MICRON TECHNOLOGY, INC., Boise, ID (US);
Abstract
A system and method for detecting abnormal program sequences on a memory device. In some examples, a timing process is initiated by either starting a timer or recording an initial timer value from the timer. A status register of the memory device is checked in response to initiating the timing process to determine whether the memory device is in a busy state corresponding to performing the program operation. The timer is stopped or a current timer value is recorded from the timer in response to determining that the memory device is not in the busy state. A determination is made to determine an elapsed time of the timer since being started or based on the initial and current timer values to provide a checked operation time. The checked operation time and the defined operation time are evaluated to determine whether the program sequence for implementing the program operation was abnormal.