The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Oct. 01, 2024
Anritsu Corporation, Kanagawa, JP;
Takashi Kanai, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
An article inspection apparatus includes a detection data output unit that incorporates a detection signal from an X-ray detector to output detection data, an image generation unit that generates an inspection image, based on the detection data, a level conversion processing unit that adjusts the detection data to improve image quality of the inspection image, when a specific inspection condition which deteriorates the image quality of the inspection image is established, and an inspection processing unit that performs inspection processing for inspecting a quality state of an article, based on inspection image data. When the specific inspection condition is established, the image generation unit generates the inspection image, based on the detection data adjusted by the level conversion processing unit, and the inspection processing unit performs the inspection processing, based on data of the inspection image.